论文标题

通过基材诱导的电子掺杂,单层WSE $ _2 $中的激子调整

Exciton tuning in monolayer WSe$_2$ via substrate induced electron doping

论文作者

Pan, Yang, Rahaman, Mahfujur, He, Lu, Milekhin, Ilya, Manoharan, Gopinath, Aslam, Muhammad Awais, Blaudeck, Thomas, Willert, Andreas, Matković, Aleksandar, Madeira, Teresa I., Zahn, Dietrich R. T.

论文摘要

我们通过底物诱导的非脱位掺杂在WSE $ _2 $单层中报告了大型激子调整。我们观察到$ \ sim $ 62 mev的红移,$ a $ ixciton以及1-2个数量级的光致发光(PL)淬火量(当单层WSE $ _2 $)与高度定向的热电含量石墨(Hopg)接触,与HBN和Sio $ $ $ $ __2 $相比。作为从Hopg到WSE $ _2 $掺杂的证据,观察到Trion发射强度的急剧增加。使用系统的PL和开尔文探针显微镜(KPFM)对WSE $ _2 $/HOPG,WSE $ _2 $/HBN和WSE $ _2 $/Graphene进行了调查,我们得出结论,这种独特的激发行为是由电子掺杂从substrate引起的。我们的结果提出了一种简单但有效的方法,用于单层WSE $ _2 $中的激子调整,该方法在基本的理解和进一步的设备开发中起着核心作用。

We report on large exciton tuning in WSe$_2$ monolayers via substrate induced non-degenerate doping. We observe a redshift of $\sim$62 meV for the $A$ exciton together with a 1-2 orders of magnitude photoluminescence (PL) quenching when the monolayer WSe$_2$ is brought in contact with highly oriented pyrolytic graphite (HOPG) compared to the dielectric substrates such as hBN and SiO$_2$. As the evidence of doping from HOPG to WSe$_2$, a drastic increase of the trion emission intensity was observed. Using a systematic PL and Kelvin probe force microscopy (KPFM) investigation on WSe$_2$/HOPG, WSe$_2$/hBN, and WSe$_2$/graphene, we conclude that this unique excitonic behavior is induced by electron doping from the substrate. Our results propose a simple yet efficient way for exciton tuning in monolayer WSe$_2$, which plays a central role in the fundamental understanding and further device development.

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