论文标题
考虑量子发射极测量中的客观镜头自动荧光
Accounting for objective lens autofluorescence in quantum emitter measurements
论文作者
论文摘要
对量子发射器的研究的兴趣兴起最近促使许多研究小组构建了自己的共聚焦落叶显微镜/光谱仪器。通常参与量子发射极测量的低光水平使得考虑到此类设置中使用的组件的任何潜在荧光来源至关重要。在本报告中，我们表明，源自各种显微镜目标的发射可能具有难以捉摸的尖锐线宽，这可能会被误认为是量子排放。许多眼镜中存在的杂质在波长中重叠，并从几个当前感兴趣的候选发射极系统中发射单个光子。仔细考虑该系统噪声对于探索性工作至关重要，这是材料的光学特性，例如过渡金属二甲构基化剂和六核氮化硼。
The rise of interest in the study of quantum emitters has recently prompted many research groups to construct their own confocal epifluorescence microscopy/spectroscopy instruments. The low light levels typically involved in quantum emitter measurements makes it critically important to account for any potential sources of background fluorescence by components used within such setups. In this report, we show that emission originating from various microscope objectives can possess elusive sharp linewidths that could potentially be mistaken for quantum emission. Impurities present in many glasses overlap in wavelength with single photon emission from several candidate emitter systems of current interest. A careful consideration of this system noise could be critical to exploratory work of the optical properties of materials such as transition metal dichalcogenides and hexagonal boron nitride.
