论文标题
一个新的实验，可使用半导体超级突数字上层建筑（SSS）检测到亚M-EV范围的暗物质
A new experiment to detect dark matter in sub-MeV range using semiconductor superlattice superstructures (SSS)
论文作者
论文摘要
在我们宇宙中，大约$ 26 \％的物质是由暗物质（DM）组成的，该暗物质（DM）仅通过引力或弱相互作用与标准模型（SM）相互作用。科学家已经提出了许多建议，即DM -Wimps，Axions，Alps，Black Holes等可能的候选者，其质量的范围可能非常宽 - 从Planck量表到$ 10^{-22} $ EV的光线。检测DM的实验极具挑战性，因为DM与普通物质没有明显的相互作用。可能是由于这种难以捉摸的性质所致，到目前为止，尽管许多实验正在进行全球进行，但仍无法检测到DM。由于其质量变化约为40个数量级的变化，因此他们的重力相互作用也很弱，并且已经提出了许多创造性的建议，以检测可能的DM候选者，具有巨大的技术和目标材料。在这项工作中，我们提出了一个新的实验，以使用半导体超级突变器上层结构（SSS）作为目标材料来检测子MEV范围DM颗粒。这样的材料具有几百毫升EV的阶距离的带隙，适合检测散射电子的亚M-MEV范围颗粒。由于SSS激发而发出的光子位于微米范围内，可以通过量子级联激光器（QCL）检测到。
About $26\%$ of the matter in our Universe is made up of Dark Matter (DM), which interacts with Standard Model (SM) matter only through gravitational or weak interactions. Many proposals have been made by scientists about the possible candidates of DM - WIMPs, axions, ALPs, black holes etc. And range of its mass could be extremely broad - from Planck scale to as light as $10^{-22}$ eV. Experiments to detect DM are extremely challenging, as DM does not exhibit appreciable interactions with ordinary matter. May be due to such elusive nature, so far it has not been possible to detect DM, though many experiments are going on worldwide to do so. With about 40 orders of magnitude variation in their mass, it is possible that their gravitational interaction too is very weak, and many creative proposals have been made to detect possible DM candidates, with vast variation of techniques and target materials. In this work, we propose a new experiment to detect sub-MeV range DM particles, using the semiconductor superlattice superstructure (SSS) as the target material. Such materials have band gap of the order of few hundreds of milli eV, and are suitable for detecting sub-MeV range particles scattering off electrons. The photons emitted as a result of excitation of SSS lie in the micrometer range and may be detected via quantum cascade lasers (QCL).
