论文标题
通过滑动痕迹鉴定多晶中的活动滑移系统 - 修饰的晶格旋转分析（ST-MLRA）
Identification of active slip systems in polycrystals by Slip Trace -- Modified Lattice Rotation Analysis (ST-MLRA)
论文作者
论文摘要
提出了一种简单而多才多艺的策略，即以含量为单位的滑移痕迹 - 修改的晶格旋转分析（ST -MLRA），以从表面信息中鉴定多晶合金中的活动滑移系统。滑动平面迹线方向用于定义潜在的活动滑动平面，而从晶粒旋转中获得了活跃滑移平面内的实际滑移方向，如变形而导致极图中晶粒方向的痕迹拉伸所示。列出了该策略在HCP MG合金中的应用示例示例。他们表明该策略易于实施，并允许在每种谷物中识别主动滑移系统。
A simple and versatile strategy, denominated Slip Trace - Modified Lattice Rotation Analysis (ST-MLRA), is presented to enable the identification of the active slip systems in polycrystalline alloys from surface information. The slip plane trace orientation is used to define the potential active slip planes while the actual slip direction within the active slip plane is obtained from the grain rotation, as indicated by the stretching of the trace of the grain orientation in the pole figure as a result of deformation. Examples of application of the strategy in a HCP Mg alloy are presented for illustration. They show that the strategy is simple to implement and allows to identify the active slip system(s) in each grain.
