论文标题
光学镊子的理论校正方法：批量和表面上胶体颗粒之间平均力的电势的获取
Theoretical correction methods for optical tweezers: Acquisition of potentials of mean forces between colloidal particles in a bulk and on a surface
论文作者
论文摘要
众所周知，线光学镊子（批次）可以测量整体中胶体颗粒之间平均力（PMF）的潜力。但是，在显示最终形式的结果之前，用批次获得的PMF进行了经验修改，以纠正长距离的潜在上升。在本字母中，我们通过使用统计力学得出了理论校正方法，以获取PMF。使用新方法，可以在没有经验拟合方程的情况下获得PMF。通过新方法，还可以获得在批次引起的两个胶体颗粒上作用的外部电势。作为另一项研究，我们解释了两种方法，用于在底物表面上获得胶体颗粒之间的PMF，其中使用了具有固定焦点的正常单个光学镊子，并在体积中使用双光束光学镊子捕获的胶体颗粒之间获得PMF。这些方法还可以获得作用于被困的两个胶体颗粒的外部电势。
It is known that line optical tweezers (LOT) can measure potential of mean force (PMF) between colloidal particles in the bulk. However, PMF obtained with LOT is empirically modified before showing the result of the final form in order to correct the potential rise at long distances. In the present letter, we derive theoretical correction methods for acquisition of PMF by using statistical mechanics. Using the new methods, PMF can be obtained without the empirical fitting equation. Through the new methods, external potential acting on the trapped two colloidal particles induced by LOT can also be obtained. As an additional study, we explain two methods for obtaining PMF between colloidal particles on a substrate surface, in which a normal single optical tweezers with a fixed focal point is used, and for obtaining PMF between colloidal particles trapped by dual-beam optical tweezers in the bulk. These methods can also obtain the external potential acting on the trapped two colloidal particles.
